Research Article
Design and Implementation of Microcode based Built-In Self-Test for Fault Detection in Memory and its Repair
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International Journal of Computer Applications
Foundation of Computer Science (FCS), NY, USA
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| Volume 78 - Issue 9 |
| Published: September 2013 |
| Authors: C. Padmini, Ch. Tejdeep |
10.5120/13519-1299
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C. Padmini, Ch. Tejdeep . Design and Implementation of Microcode based Built-In Self-Test for Fault Detection in Memory and its Repair. International Journal of Computer Applications. 78, 9 (September 2013), 27-33. DOI=10.5120/13519-1299
@article{ 10.5120/13519-1299,
author = { C. Padmini,Ch. Tejdeep },
title = { Design and Implementation of Microcode based Built-In Self-Test for Fault Detection in Memory and its Repair },
journal = { International Journal of Computer Applications },
year = { 2013 },
volume = { 78 },
number = { 9 },
pages = { 27-33 },
doi = { 10.5120/13519-1299 },
publisher = { Foundation of Computer Science (FCS), NY, USA }
}
%0 Journal Article
%D 2013
%A C. Padmini
%A Ch. Tejdeep
%T Design and Implementation of Microcode based Built-In Self-Test for Fault Detection in Memory and its Repair%T
%J International Journal of Computer Applications
%V 78
%N 9
%P 27-33
%R 10.5120/13519-1299
%I Foundation of Computer Science (FCS), NY, USA
Abstract
Memories are the most dominating blocks present on a chip. All types of chips contain embedded memories such as a ROM, SRAM, DRAM, and flash memory. Testing of these memories is a very tedious and challenging job as area over head, testing time and cost of the test play an important role. Embedded memories are occupying a significant portion of the System-on-chip area. Because of this trend and the nature of memory's small geometry, implementing a good memory testing strategy is one of the most significant decision making. Built-In Self-Test, a design technique which uses parts of the circuit to test the circuit itself is used for testing. BIST controller is used to control the total testing process of the memory.
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